For the testing challenges of tomorrow, traditional ATE falls short. Test engineers need smart ATE for the smart devices of the IoT.
Smarter ATE enables test engineers to:
anticipate and economically incorporate technology advances into their test systems
use an open-platform of modular hardware and scalable software.
Also included in the download is a case study showing how IDT reduced the costs of “big-iron ATE” through trial and error by first building their own systems and then looking to a modular solution.
Download now.
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This white paper is sponsored by National Instruments.
