For the testing challenges of tomorrow, traditional ATE falls short. Test engineers need smart ATE for the smart devices of the IoT.

Smarter ATE enables test engineers to:

When Exposed to IoT, Big Iron ATE Will Rust
  • anticipate and economically incorporate technology advances into their test systems 
  • use an open-platform of modular hardware and scalable software.
Also included in the download is a case study showing how IDT reduced the costs of “big-iron ATE” through trial and error by first building their own systems and then looking to a modular solution.

Download now.

Please note that a valid email address is required to receive this white paper.

This white paper is sponsored by National Instruments.